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Single-particle evanescent light scattering simulations for total internal reflection microscopy

Laurent Helden, Elena Eremina, Norbert Riefler, Christopher Hertlein, Clemens Bechinger, Yuri Eremin, and Thomas Wriedt

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Abstract

We simulate and measure light scattering of a micrometer-sized spherical particle suspended in solution close to a glass substrate. The model, based on the discrete sources method, is developed to describe the experimental situation of total internal reflection microscopy experiments; i.e., the particle is illuminated by an evanescent light field originating from the glass–solvent interface. In contrast to the well-established assumption of a simple exponential decay of the scattering intensity with distance, we demonstrate significant deviations for a certain range of penetration depths and polarization states of the incident light.

© 2006 Optical Society of America

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