Abstract

Precise measurement of the refractive index of chemical vapor deposition (CVD) ZnSe with the Fourier-transform interference refractometry method from 0.9 to $21.7\mathrm{\mu m}$ (from 11,000 to $460{\mathrm{cm}}^{-1}$) with $0.1{\mathrm{cm}}^{-1}$ resolution is described. For this measurement, structurally homogeneous ZnSe plates were grown on a substrate with an optimized temperature increase. Using three ZnSe plates of different thicknesses, we managed to raise the measurement accuracy of the refractive index up to $2\times {10}^{-5}$ (being nearly 1 order of magnitude better than the available data) in the near IR and most of the middle IR wavelength range from 0.9 to $12.5\mathrm{\mu m}$ (wavenumber range of $11,000–800{\mathrm{cm}}^{-1}$) and up to $1\dots 4\times {10}^{-4}$ in the $12.5–21.7\mathrm{\mu m}$ ($800–460{\mathrm{cm}}^{-1}$) region. The experimental results are approximated by a generalized Cauchy dispersion function of the 8th power. Spectral wavelength dependencies of the first- and second-order derivatives of the refractive index are calculated, and the zero material dispersion wavelength is found to be ${\lambda }_0=4.84\mathrm{\mu m}$.

© 2010 Optical Society of America

Gradient infrared optical material prepared by a chemical vapor deposition process

Michael A. Pickering, Raymond L. Taylor, and Duncan T. Moore
Appl. Opt. 25(19) 3364-3372 (1986)

Refractive index spectral dependence, Raman spectra, and transmission spectra of high-purity Si28, Si29, Si30, and Sinat single crystals

Victor G. Plotnichenko, Vitaly O. Nazaryants, Elena B. Kryukova, Vasily V. Koltashev, Vyacheslav O. Sokolov, Anatoly V. Gusev, Vladimir A. Gavva, Tatiana V. Kotereva, Mikhail F. Churbanov, and Eugeny M. Dianov
Appl. Opt. 50(23) 4633-4641 (2011)

Refractive index spectral dependence, Raman spectra, and transmission spectra of high-purity ⁷²Ge, ⁷³Ge, ⁷⁴Ge, ⁷⁶Ge, and ^natGe single crystals

Victor A. Lipskiy, Vitaly O. Nazaryants, Tatiana V. Kotereva, Andrei D. Bulanov, Vladimir A. Gavva, Vasily V. Koltashev, Mikhail F. Churbanov, and Victor G. Plotnichenko
Appl. Opt. 58(27) 7489-7496 (2019)

Surface and bulk absorption characteristics of chemically vapor-deposited zinc selenide in the infrared

Claude A. Klein, Richard P. Miller, and Donald L. Stierwalt
Appl. Opt. 33(19) 4304-4313 (1994)

Post-processing ZnSe optical fibers with a micro-chemical vapor transport technique

Alex T. Hendrickson, Stephen C. Aro, Justin R. Sparks, Michael G. Coco, James P. Krug, Carly J. Mathewson, Sean A. McDaniel, Pier J. Sazio, Gary Cook, Venkatraman Gopalan, and John V. Badding
Opt. Mater. Express 10(12) 3125-3136 (2020)