Abstract

A method is described for measuring the amplitude and phase of the complex Kerr magnetooptic coefficients. A magnetic metal surface to be measured is switched between its magnetic states at an ac rate, thereby modulating a reflected light beam. By measuring the modulation depth with a synchronous detector and one angle, the two quantities above are determined. The method requires no precision optical equipment as is needed with polarimetric techniques.

© 1966 Optical Society of America

Ellipsometric measurement of the Kerr magnetooptic effect

Henry T. Minden
Appl. Opt. 18(6) 813-817 (1979)

Measurement of reflectivities for magnetooptical media

M. Ruane, M. Mansuripur, and R. Rosenvold
Appl. Opt. 25(12) 1946-1951 (1986)

Accurate Method for Determining Photometric Linearity

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Photoelastic modulated ellipsometry on magnetooptic multilayer films

Gerard J. Sprokel
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Measuring the wavelength dependence of magnetooptical Kerr (or Faraday) rotation and ellipticity: a technique

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