Abstract

Optical constants of thin metal films are strongly dependent on deposition conditions, growth mode, and thickness. We propose a universal characterization approach that allows reliable determination of thin metal film optical constants as functions of wavelength and thickness. We apply this approach to determination of refractive index dispersion of silver island films embedded between silica layers.

© 2011 Optical Society of America

Comparison of two techniques for reliable characterization of thin metal–dielectric films

Tatiana V. Amotchkina, Michael K. Trubetskov, Alexander V. Tikhonravov, Vesna Janicki, Jordi Sancho-Parramon, and Hrvoje Zorc
Appl. Opt. 50(33) 6189-6197 (2011)

Design and production of bicolour reflecting coatings with Au metal island films

Vesna Janicki, Tatiana V. Amotchkina, Jordi Sancho-Parramon, H. Zorc, Michael K. Trubetskov, and Alexander V. Tikhonravov
Opt. Express 19(25) 25521-25527 (2011)

Use of gold island films in design of reflectors with high luminosity

Hrvoje Zorc, Martin Lončarić, and Jordi Sancho-Parramon
Appl. Opt. 50(9) C364-C367 (2011)

Manufacture and characterization of optical coatings with incorporated copper island films

Mario Held, Olaf Stenzel, Steffen Wilbrandt, Norbert Kaiser, and Andreas Tünnermann
Appl. Opt. 51(19) 4436-4447 (2012)

Optical properties of a metal island film close to a smooth metal surface

Alfred Leitner, Zhensheng Zhao, Harald Brunner, Franz R. Aussenegg, and Alexander Wokaun
Appl. Opt. 32(1) 102-110 (1993)