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Computational manufacturing as a key element in the design–production chain for modern multilayer coatings

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Abstract

We propose a general approach that allows one to reveal factors causing production errors in the course of the deposition process controlled by broadband optical monitoring. We consider computational experiments simulating the real deposition process as a crucial point of this approach. We demonstrate application of the approach using multiple experimental deposition runs of the selected multilayer coatings.

© 2012 Optical Society of America

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