Abstract

The parameters of the semiconductor laser source are vital for the performances of optical coherent systems. In this paper, a novel method to measure the phase-shift ${\phi }_m$ between laser central optical-frequency modulation (COFM) and the accompanied optical-intensity modulation (AOIM) is proposed, which is easy to realize and requires no further fiber etalons or high-speed demodulators. An orthogonal test is utilized to measure ${\phi }_m$. Experimental results show that the value of ${\phi }_m$ approaches $1.09\pi$ under different COFM conditions. Then the interference model of phase-generated carrier (PGC) demodulation is modified by taking into account the effect of ${\phi }_m$, and the influences of ${\phi }_m$ on the demodulation results using two methods (look-up table and AOIM-factor division) are further analyzed in detail.

© 2013 Optical Society of America

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