Synthetic-wavelength interferometry improved with frequency calibration and unambiguity range extension

Claudius Weimann; Markus Fratz; Harald Wölfelschneider; Wolfgang Freude; Heinrich Höfler; Christian Koos

doi:10.1364/AO.54.006334

Applied Optics
Vol. 54,
Issue 20,
pp. 6334-6343
(2015)
•https://doi.org/10.1364/AO.54.006334

Synthetic-wavelength interferometry improved with frequency calibration and unambiguity range extension

Claudius Weimann, Markus Fratz, Harald Wölfelschneider, Wolfgang Freude, Heinrich Höfler, and Christian Koos

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Claudius Weimann, Markus Fratz, Harald Wölfelschneider, Wolfgang Freude, Heinrich Höfler, and Christian Koos, "Synthetic-wavelength interferometry improved with frequency calibration and unambiguity range extension," Appl. Opt. 54, 6334-6343 (2015)

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Abstract

We improve the accuracy of distance measurements with synthetic-wavelength interferometry by referencing the spectral spacing of the free-running light sources to a high-precision radio-frequency oscillator. In addition, we increase the unambiguity range with a time-of-flight technique. Distances to scattering technical surfaces can be measured with micrometer accuracy and an unambiguity range of 1.17 m. The measurement rate amounts to 300 Hz.

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Opt. Wavelength	Synth. Wavelength	Second-order Synth. Wavelength
$λ_{1} = 1547.11 nm$	$Λ_{12} = 1.56 mm$	$Λ_{12, 23} = 8.38 mm$
$λ_{2} = 1548.65 nm$	$Λ_{13} = 0.71 mm$	$Λ_{23, 34} = 3.97 mm$
$λ_{3} = 1550.48 nm$	$Λ_{14} = 0.41 mm$	$Λ_{13, 24} = 2.69 mm$
$λ_{4} = 1552.92 nm$	$Λ_{23} = 1.31 mm$
	$Λ_{24} = 0.56 mm$
	$Λ_{34} = 0.99 mm$

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Applied Optics