Abstract

In order to understand the photoemission mechanism of the reflection-mode InGaAs photocathode with a thin emission layer, the formula describing reflection-mode quantum efficiency is revised by solving the one-dimensional continuity equation, in which the electrons generated in the GaAs buffer layer are considered. Compared with the conventional formula, the revised formula is proved to be more suitable for the reflection-mode InGaAs photocathode with a thin emission layer. In experiment, the InGaAs sample goes through two-step surface preparation including a wet chemical cleaning process and a heat treatment process. Then the sample is activated by Cs/O and the experimental quantum efficiency curves are measured simultaneously every other hour. The measured results show that the shapes of the quantum efficiency curves degrade with time because of the contamination of residual gases in the vacuum system. All the quantum efficiency curves are well fitted by the revised formula.

© 2015 Optical Society of America

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