Abstract
We have accurately determined the absorptance of three pyrheliometer cavities at 532 nm by measuring the residual reflectance using an angle-resolved bidirectional reflectometer. Measurements were performed at a normal incidence as a function of the viewing angle and position on the cavity cone. By numerically integrating the measured angle-resolved scatter over both the direction and position and accounting for an obstructed view of the cavity, we determined that the effective cavity reflectance was between and . Thus, the absorptance of the three cavities ranged from to ( combined expanded uncertainties). These measurements, when extended over the spectral range of operation of the pyrheliometer, are required to establish SI traceability for absolute solar irradiance measurements.
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