Abstract
In a previous work, we introduced the concept of transversal aberrations calculated at arbitrary Hartmann-plane distances [Appl. Opt. 55, 2160 (2016) [CrossRef] ]. These transversal aberrations can be used to estimate the wave aberration function , as well as the classical transversal aberrations calculated at a theoretical plane , where is the radius of a reference semisphere. However, when the ray identification is difficult to achieve at , the use of can be of great help. In the context of a least-squares fitting of the Hartmann data, the use of is proposed by analyzing some simple examples for the case of a with aberration terms up to the third order. These examples also consider the hypothesis , as presented in the majority of the optical applications.
© 2017 Optical Society of America
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