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Use of a broadband monitoring system for the determination of the optical constants of a dielectric bilayer

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Abstract

This paper extends a method previously applied to the determination of the optical constants of a high-index thin film to a dielectric bilayer. This method is based on the time recording of the spectral transmittance of the stack during its deposition with the help of an in situ broadband monitoring system.

© 2018 Optical Society of America

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