Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Reliability assessment of an optical current sensor based on accelerated aging tests

Not Accessible

Your library or personal account may give you access

Abstract

The operational reliability directly affects the practical application of optical current transformers (OCTs) in smart substations. As the key component of the OCT, the reliability of the optical current sensor (OCS) largely determines the reliability level of the OCT. This paper proposes a reliability assessment method of the OCS based on accelerated aging tests. The failure modes and failure mechanisms of the OCS are analyzed, and the concept of OCS insertion loss variation is proposed. An allowable range of insertion loss variation is selected as the failure criterion of the OCS. From the viewpoint of the OCS measurement error generated by the quantization error of the analog-to-digital converter, the allowable range of insertion loss variation is obtained. By selecting a high temperature as the accelerated thermal stress, we design the accelerated aging test scheme of the OCS and analyze the sample test data to obtain the activation energy of the OCS insertion loss failure. Based on this activation energy, the median time to failure and instantaneous failure rate curve of the OCS at normal temperature are obtained. The results indicate that the designed OCS has an expected service life of 50 years and a low instantaneous failure rate at normal temperature. This paper provides basic critical reliability analysis data for the system reliability assessment of OCTs.

© 2019 Optical Society of America

Full Article  |  PDF Article
More Like This
Prediction of lifetime by lumen degradation and color shift for LED lamps, in a non-accelerated reliability test over 20,000  h

Jian Hao, Hong-Liang Ke, Lei Jing, Qiang Sun, and Ren-Tao Sun
Appl. Opt. 58(7) 1855-1861 (2019)

Disparity between online and offline tests in accelerated aging tests of LED lamps under electric stress

Yao Wang, Lei Jing, Hong-Liang Ke, Jian Hao, Qun Gao, Xiao-xun Wang, Qiang Sun, and Zhi-Jun Xu
Appl. Opt. 55(27) 7511-7516 (2016)

Analysis of junction temperature and modification of luminous flux degradation for white LEDs in a thermal accelerated reliability test

Hong-Liang Ke, Lei Jing, Jian Hao, Qun Gao, Yao Wang, Xiao-xun Wang, Qiang Sun, and Zhi-Jun Xu
Appl. Opt. 55(22) 5909-5916 (2016)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Figures (10)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Tables (5)

You do not have subscription access to this journal. Article tables are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Equations (21)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.