Stephen M. Anthony, Philip R. Miller, Jerilyn A. Timlin, and Ronen Polsky, "Imaging effectiveness calculator for non-design microscope samples," Appl. Opt. 58, 6027-6037 (2019)
When attempting to integrate single-molecule fluorescence microscopy
with microfabricated devices such as microfluidic channels,
fabrication constraints may prevent using traditional coverslips.
Instead, the fabricated devices may require imaging through material
with a different thickness or index of refraction. Altering either can
easily reduce the quality of the image formation (measured by the
Strehl ratio) by a factor of 2 or more, reducing the signal-to-noise
ratio accordingly. In such cases, successful detection of
single-molecule fluorescence may prove difficult or impossible. Here
we provide software to calculate the effect of non-design materials
upon the Strehl ratio or ensquared energy and explore the impact of
common materials used in microfabrication.
This software is designed to calculate the effect of non-design microscope coverslip materials upon the Strehl ratio or ensquared energy using the Gibson-Lanni point spread function (PSF) model.
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For compounds where the index of refraction at 532 nm
was not directly available, it was calculated using the index
of refraction and reciprocal dispersion (Abbe number) at a
different wavelength (See Appendix 6).
Table 3.
Indices of Refraction at 532 nm for Various Materialsa
For compounds where the index of refraction at 532 nm
was not directly available, it was calculated using the index
of refraction and reciprocal dispersion (Abbe number) at a
different wavelength (see Appendix 6). Note that as
seen in Table 2, the index of refraction can vary even within
identically named materials (e.g., borosilicate glass, soda
lime glass). As such, the indices of refraction in this table
may only represent particular examples of a material.
For compounds where the index of refraction at 532 nm
was not directly available, it was calculated using the index
of refraction and reciprocal dispersion (Abbe number) at a
different wavelength (See Appendix 6).
Table 3.
Indices of Refraction at 532 nm for Various Materialsa
For compounds where the index of refraction at 532 nm
was not directly available, it was calculated using the index
of refraction and reciprocal dispersion (Abbe number) at a
different wavelength (see Appendix 6). Note that as
seen in Table 2, the index of refraction can vary even within
identically named materials (e.g., borosilicate glass, soda
lime glass). As such, the indices of refraction in this table
may only represent particular examples of a material.
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