Multi-field merit-function-based regression method for Wide Field Infrared Survey Telescope grism system alignment

Margaret Z. Dominguez; Hyukmo Kang; Seonghui Kim; Joshua Berrier; Victor J. Chambers; Qian Gong; John G. Hagopian; Catherine T. Marx; Laurie Seide; Dae Wook Kim

doi:10.1364/AO.58.006802

Applied Optics
Vol. 58,
Issue 25,
pp. 6802-6812
(2019)
•https://doi.org/10.1364/AO.58.006802

Multi-field merit-function-based regression method for Wide Field Infrared Survey Telescope grism system alignment

Margaret Z. Dominguez, Hyukmo Kang, Seonghui Kim, Joshua Berrier, Victor J. Chambers, Qian Gong, John G. Hagopian, Catherine T. Marx, Laurie Seide, and Dae Wook Kim

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Margaret Z. Dominguez, Hyukmo Kang, Seonghui Kim, Joshua Berrier, Victor J. Chambers, Qian Gong, John G. Hagopian, Catherine T. Marx, Laurie Seide, and Dae Wook Kim, "Multi-field merit-function-based regression method for Wide Field Infrared Survey Telescope grism system alignment," Appl. Opt. 58, 6802-6812 (2019)

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Abstract

The grating prism (grism), slitless spectrometer aboard the Wide Field Infrared Survey Telescope enables a survey of emission-line galaxies. To facilitate its opto-mechanical alignment, a six-degree-of-freedom element was fabricated using alignment fiducials and integral flats and used to measure a wavefront by using an infrared interferometer placed at various field points over a $20 \times 14 \deg$ field of view in the grism coordinate frame. Modeling identified E2 to be the most sensitive element to the grism wavefront error and was used to efficiently align the system. The merit function regression method for a wide field of view was further used to verify the higher efficiency and accuracy of the proposed alignment technique compared with the conventional sensitivity table method.

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Wavelength range (μm)	1.0–1.9
WFIRST FOV (deg)	$0.75 \times 0.383$
Average beam diameter at grism (mm)	100
Beam f/-ratio at grism (mm)	$\sim f / 8$
Wavefront error	Diffraction limited at $λ > 1.0 μm$
Spectral resolution	435–856
Capability	Dispersion and pointing for spectrometer
Compactness	$\sim 80 mm$ total thickness for a fixed diameter $\sim 120 mm$
Beam deviation	Zero at 1.55 μm

Field Position No.	1	2	3	4	5	6	7
Measured WFE RMS [nm]	$201 \pm 6$	$216 \pm 6$	$311 \pm 7$	$265 \pm 7$	$307 \pm 7$	$259 \pm 7$	$186 \pm 6$
Multi-field MF calculated WFE RMS [nm]	$234 \pm 1$	$204 \pm 2$	$324 \pm 1$	$272 \pm 1$	$269 \pm 1$	$220 \pm 1$	$168 \pm 2$

E2 DOF Adjustment	Measured with Theodolite/ Micrometer	Multi-Field MF Regression Method Modeled
E2-E3 Z-space ( $Δ z$ ) [μm]	$323 \pm 75$	$407.2 \pm 2.3$
E2 tilt about $X$ ( $θ_{x}$ ) [deg]	$- 0.190 \pm 0.025$	$- 0.187 \pm 0.002$
E2 tilt about $Y$ ( $θ_{y}$ ) [deg]	$0.110 \pm 0.025$	$0.124 \pm 0.0004$
E2 clocking about $Z$ [deg]	$0.040 \pm 0.034$	$0 \pm 0.0$

Wavelength range (μm)	1.0–1.9
WFIRST FOV (deg)	$0.75 \times 0.383$
Average beam diameter at grism (mm)	100
Beam f/-ratio at grism (mm)	$\sim f / 8$
Wavefront error	Diffraction limited at $λ > 1.0 μm$
Spectral resolution	435–856
Capability	Dispersion and pointing for spectrometer
Compactness	$\sim 80 mm$ total thickness for a fixed diameter $\sim 120 mm$
Beam deviation	Zero at 1.55 μm

Field Position No.	1	2	3	4	5	6	7
Measured WFE RMS [nm]	$201 \pm 6$	$216 \pm 6$	$311 \pm 7$	$265 \pm 7$	$307 \pm 7$	$259 \pm 7$	$186 \pm 6$
Multi-field MF calculated WFE RMS [nm]	$234 \pm 1$	$204 \pm 2$	$324 \pm 1$	$272 \pm 1$	$269 \pm 1$	$220 \pm 1$	$168 \pm 2$

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Applied Optics