Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Prediction of lifetime by lumen degradation and color shift for LED lamps, in a non-accelerated reliability test over 20,000 h

Not Accessible

Your library or personal account may give you access

Abstract

Although the predicted lifetime of the classical 6000 h test given by Energy Star is taken as the normal lifetime of LED products in most research and applications, the aim of this study is to explore the error in lifetime prediction of LED lamps based on the 6000 h test. A non-accelerated aging test with 10 LED lamps is conducted for 20,000 h (from March 2016 to now) under room temperature, which is long enough for this kind of lamp reaching the real lifetime with the normalized luminous flux dropping to 70% naturally. At different aging periods, the correspondent lifetime of each sample is predicted by the lumen degradation, and the median lifetime τ0.5 of 10 samples is obtained by applying the Weibull distribution. Result shows that the τ0.5 of the real lifetime is 16,867 h in this work, and the aging time should be at least 9000 h to make the error in predicting the lifetime less than 3%. On the other hand, the Duv values of 0.006, 0.007, and 0.008 are taken as the three thresholds for predicting the lifetime by color shift. For the case of 0.008, the calculated shape parameter of 8.4 in Weibull distribution is similar with that of the real lifetime, which means the Duv of 0.008 for this kind of lamp gives the same failure mechanism as that of lumen degradation of 70%.

© 2019 Optical Society of America

Full Article  |  PDF Article
More Like This
Lumen degradation analysis of LED lamps based on the subsystem isolation method

Hong-Liang Ke, Jian Hao, Jian-Hui Tu, Pei-Xian Miao, Chao-Quan Wang, Jing-Zhong Cui, Qiang Sun, and Ren-Tao Sun
Appl. Opt. 57(4) 849-854 (2018)

Disparity between online and offline tests in accelerated aging tests of LED lamps under electric stress

Yao Wang, Lei Jing, Hong-Liang Ke, Jian Hao, Qun Gao, Xiao-xun Wang, Qiang Sun, and Zhi-Jun Xu
Appl. Opt. 55(27) 7511-7516 (2016)

Analysis of junction temperature and modification of luminous flux degradation for white LEDs in a thermal accelerated reliability test

Hong-Liang Ke, Lei Jing, Jian Hao, Qun Gao, Yao Wang, Xiao-xun Wang, Qiang Sun, and Zhi-Jun Xu
Appl. Opt. 55(22) 5909-5916 (2016)

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Figures (11)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Tables (5)

You do not have subscription access to this journal. Article tables are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Equations (9)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Metrics

Select as filters


Select Topics Cancel
© Copyright 2022 | Optica Publishing Group. All Rights Reserved