Abstract

In a spectral beam combination system, temperature increase of the multilayer dielectric grating (MDG) worsens the far-field beam quality of the output laser. To accurately monitor the surface temperature of the MDG, this study deposits ${\rm VO_{2}}$ phase-change film on the lowest layer of multilayer dielectric films in the MDG and tests the transmittance with a probe laser. Based on this measurement, the surface temperature of the MDG can be calculated. Additionally, the study analyzes the influence of ${{\rm VO}_2}$ film on the surface electric field and the ${-}{1}$ diffraction efficiency of the MDG and presents a specific example of using ${{\rm VO}_2}$ film to test high reflector temperature. The study concludes that ${{\rm VO}_2}$ film is a feasible method of measuring temperature and better than an infrared thermal imager.

© 2020 Optical Society of America

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