Abstract

We propose a phase retrieval method using axial diffraction patterns under planar and spherical wave illuminations. The proposed method uses a ptychographic iterative engine (PIE) for the phase retrieval algorithm. The proposed approach uses multiple diffraction patterns. Thus, adjusting the alignment of each diffraction pattern is mandatory, and we propose a method to adjust the alignment. In addition, a random selection of the measured diffraction patterns is used to further accelerate the convergence of the PIE-based optimization. To confirm the effectiveness of the proposed method, we compare the conventional and proposed methods using a simulation and optical experiments.

© 2020 Optical Society of America

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