Abstract

A light field microscope can realize three-dimensional measurement through only one exposure by the addition of a critical optical component called a microlens array (MLA). MLA errors will introduce aberrations in the captured image and then affect measurement results. This paper proposes a light field measuring system with aberration correction based on imaging analysis. The effect of MLA errors is investigated and quantitatively analyzed through a series of simulation studies. Aberration correction is realized based on computational imaging, in which an image segmentation and fusion distortion model is employed to correct the distortion, while a gradient-based linear recognition algorithm is used to address MLA rotation errors. Experimental results show that the developed light field measuring system can achieve improved measurement accuracy by correcting aberrations with the proposed algorithms.

© 2020 Optical Society of America

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