Abstract

Tomographic diffractive microscopy (TDM) is increasingly gaining attention, owing to its high-resolution, label-free imaging capability. Fast acquisitions necessitate limiting the number of holograms to be recorded. Reconstructions then rely on optimal Fourier space filling to retain image quality and resolution, that is, they rely on optimal scanning of the tomographic illuminations. In this work, we theoretically study reflection TDM, and then the 4Pi TDM, a combination of transmission and reflection systems. Image simulations are conducted to determine optimal angular sweeping. We found that three-dimensional uniform scanning fills Fourier space the best for both reflection and 4Pi configurations, providing a better refractive index estimation for the observed sample.

© 2021 Optical Society of America

Optimizing sample illumination scanning in transmission tomographic diffractive microscopy

Asemare Mengistie Taddese, Nicolas Verrier, Matthieu Debailleul, Jean-Baptiste Courbot, and Olivier Haeberlé
Appl. Opt. 60(6) 1694-1704 (2021)

Versatile transmission/reflection tomographic diffractive microscopy approach

Ludovic Foucault, Nicolas Verrier, Matthieu Debailleul, Jean-Baptiste Courbot, Bruno Colicchio, Bertrand Simon, Laurent Vonna, and Olivier Haeberlé
J. Opt. Soc. Am. A 36(11) C18-C27 (2019)

Simplified tomographic diffractive microscopy for axisymmetric samples

Ludovic Foucault, Nicolas Verrier, Matthieu Debailleul, Bertrand Simon, and Olivier Haeberlé
OSA Continuum 2(4) 1039-1055 (2019)

High-resolution tomographic diffractive microscopy in reflection configuration

Guillaume Maire, Yi Ruan, Ting Zhang, Patrick C. Chaumet, Hugues Giovannini, Daniel Sentenac, Anne Talneau, Kamal Belkebir, and Anne Sentenac
J. Opt. Soc. Am. A 30(10) 2133-2139 (2013)

Tomographic diffractive microscopy and multiview profilometry with flexible aberration correction

H. Liu, J. Bailleul, B. Simon, M. Debailleul, B. Colicchio, and O. Haeberlé
Appl. Opt. 53(4) 748-755 (2014)