Bidirectional reflectance capabilities of the NIST Robotic Optical Scattering Instrument

Heather J. Patrick; Catherine C. Cooksey; Thomas A. Germer; Maria E. Nadal; Clarence J. Zarobila

doi:10.1364/AO.435117

Applied Optics
Vol. 60,
Issue 28,
pp. 8774-8786
(2021)
•https://doi.org/10.1364/AO.435117

Bidirectional reflectance capabilities of the NIST Robotic Optical Scattering Instrument

Heather J. Patrick, Catherine C. Cooksey, Thomas A. Germer, Maria E. Nadal, and Clarence J. Zarobila

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Heather J. Patrick, Catherine C. Cooksey, Thomas A. Germer, Maria E. Nadal, and Clarence J. Zarobila, "Bidirectional reflectance capabilities of the NIST Robotic Optical Scattering Instrument," Appl. Opt. 60, 8774-8786 (2021)

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Table of Contents Category
- Instrumentation and Measurements
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About this Article
History
- Original Manuscript: June 24, 2021
- Revised Manuscript: August 25, 2021
- Manuscript Accepted: August 30, 2021
- Published: September 27, 2021

Abstract

The National Institute of Standards and Technology (NIST) Robotic Optical Scattering Instrument (ROSI) serves as the national reference instrument for specular and diffuse bidirectional reflectance measurements in the ultraviolet to short-wave infrared wavelength regions. This paper gives a comprehensive overview of the design, operation, and capabilities of ROSI. We describe measurement methods for diffuse and specular reflectance, identify and quantify the elements of the uncertainty budget, and validate the reflectance scale through comparison with NIST’s previous reference instrument, the Spectral Tri-function Automated Reference Reflectometer. Examples of the range of ROSI’s capabilities, including the limits for low-reflectance measurements and a research application using out-of-plane measurements of bidirectional reflectance for remote sensing reference reflectors, are also covered.

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Data Availability

Data underlying the results presented in this paper are not publicly available at this time but may be obtained from the authors upon reasonable request.

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Wavelength Range	Source	Detector
250 to 500 nm	LDLS	Silicon photodiode
$> 500$ to 1050 nm	SC	Silicon photodiode
$> 1050$ to 2400 nm	SC	EIGA photodiode on integrating sphere

Goniometer Specifications
Parameter	Specification	Notes
Robot type	Articulated arm	$\pm 0.02 m m$ positioning repeatability
Number of axes	6	Enables full hemispherical scanning
Sample size	25 mm (min) to 300 mm (max)	Thickness 0 mm to 40 mm
Sample payload	3.5 kg nominal; 9 kg max	Including sample holder
Sample attachment	Mechanical or vacuum chuck
Sample translation	$\pm 75 m m$ from center	Nominal
Receiver arm rotation	360° about robot
Receiver distance	658 mm	Nominal, see Section 4.2
Optical Specifications
Parameter	Specification	Notes
Measurement types	Reflectance, BRDF, Reflectance Factor	Bidirectional transmittance distribution function (BTDF) at limited geometries
Measurement technique	Absolute
Source type	Tunable SC or LDLS/monochromator	See Section 3.A
Wavelengths	250 nm–2400 nm	Quasi-monochromatic
Source bandwidth	14 nm	Full-width at half maximum (FWHM) bandwidth
Minimum wavelength step	10 nm	Recommended due to bandwidth
Incident beam diameter	10 mm	At normal incidence
Polarization	Linear incident	Rotatable
Detector types	Silicon, EIGA on integrating sphere
Solid angle of collection	0.0026 sr	Nominal, subtends about 3.3°, see Section 4.2
Incident angle	$θ_{i} = 0^{\circ} - 80^{\circ}, ϕ_{i} = 0^{\circ} - 360^{\circ}$	Based on 10 mm incident beam
Viewing angle	$θ_{r} = 0^{\circ} - 88^{\circ}, ϕ_{r} = 0^{\circ} - 360^{\circ}$	Full hemispherical scanning, unobstructed view of sample, retroreflection excluded.

Source of Uncertainty	Standard Uncertainty	Relative Uncertainty Expression	Relative Uncertainty Contribution
Receiver/Monitor Gain Ratio Stability		$u (R_{S})$
$250 n m \leq λ \leq 990 n m$	0.04%		0.0004
$1000 n m \leq λ \leq 2400 n m$	0.08%		0.0008
Detector Uniformity		$u (U_{D})$
$250 n m \leq λ \leq 990 n m$	0.04%		0.0004
$1000 n m \leq λ \leq 2400 n m$	0.01%		0.0001
Detector Noise		$u (R_{V}) / R_{V}$
$250 n m \leq λ \leq 990 n m$	$< 0.01 %$		$< 0.0001$
$1000 n m \leq λ \leq 2400 n m$	$< 0.01 %$		$< 0.0001$
Wavelength		$\frac{1}{ρ} \frac{\partial ρ}{\partial λ} u (λ)$
250 nm	0.7 nm		0.0004
$260 n m \leq λ \leq 840 n m$	0.7 nm		0.0001
$850 n m \leq λ \leq 1050 n m$	0.7 nm		0.0003
$1060 n m \leq λ \leq 2400 n m$	0.7 nm		$< 0.0001$
Sample Uniformity		$u_{r e l} (U_{s})$	0.0002
Sample Alignment	0.05°	$\frac{1}{ρ} \frac{\partial ρ}{\partial θ_{i}} u (θ_{i})$	$< 0.0001$

Source of Uncertainty	Standard Uncertainty	Relative Uncertainty Expression	Relative Uncertainty Contribution
Aperture Distance	0.09 mm	$2 u (D) / D$	0.0003
Aperture Area	$0.77 {m m}^{2}$	$u (A) / A$	$< 0.0001$
Finite Solid Angle Calculation	0.05%	$u (C_{f}) / C_{f}$	0.0005
Viewing Angle	0.05º	$\frac{1}{f_{r}} \frac{\partial f_{r}}{\partial θ_{r}} - \tan θ_{r}$	0.0009
Illumination Centering	0.5 mm	$u (C_{I})$	0.0016
Detector Gain Ratio		$u (R_{G}) / R_{G}$
$λ < 1050 n m$	0.06%		0.0006
$λ \geq 1050 n m$	0.03%		0.0003
Lock-in Amplifier Sensitivity Ratio		$u (R_{L}) / R_{L}$
$λ < 1050 n m$	0.02%		0.0002
$λ \geq 1050 n m$	0.15%		0.0015
Receiver/Monitor Gain Ratio Stability		$u (R_{S})$
$λ < 1050 n m$	0.04%		0.0004
$λ \geq 1050 n m$	0.08%		0.0008
Receiver Efficiency Uniformity		$u (C_{e}) / C_{e}$
$λ < 1050 n m$	0.32%		0.0032
$λ \geq 1050 n m$	0.21%		0.0021
Detector Noise		$u (R_{V}) / R_{V}$
$λ < 1050 n m$	0.01%		0.0001
$1050 n m \leq λ < 2300 n m$	0.05%		0.0005
$2300 n m \leq λ < 2400 n m$	0.3%		0.003
$λ = 2400 n m$	0.9%		0.009
Wavelength	0.7 nm	$\frac{1}{f_{r}} \frac{\partial f_{r}}{\partial λ} u (λ)$
$λ < 325 n m$			0.0013
$325 n m \leq λ < 425 n m$			0.0004
$425 n m \leq λ < 1900 n m$			$< 0.0001$
$λ \geq 1900 n m$			0.0002
Sample Uniformity	0.07%	$u_{rel} (U_{s})$	0.0007
Incident Angle	0.05º	$\frac{1}{f_{r}} \frac{\partial f_{r}}{\partial θ_{i}} u (θ_{i})$	$< 0.0001$

Wavelength Range	Source	Detector
250 to 500 nm	LDLS	Silicon photodiode
$> 500$ to 1050 nm	SC	Silicon photodiode
$> 1050$ to 2400 nm	SC	EIGA photodiode on integrating sphere

Heather J. Patrick	https://orcid.org/0000-0002-9752-3769
Catherine C. Cooksey	https://orcid.org/0000-0001-9411-6650

Abstract

Data Availability

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Figures (12)

Tables (4)

Equations (21)

Applied Optics