Pyroelectric detector-based method for low uncertainty spectral irradiance and radiance responsivity calibrations in the infrared using tunable lasers

Brian G. Alberding; John T. Woodward; Ping-Shine Shaw; Leonard M. Hanssen; Catherine C. Cooksey; Joseph P. Rice

doi:10.1364/AO.455412

Applied Optics
Vol. 61,
Issue 11,
pp. 2957-2966
(2022)
•https://doi.org/10.1364/AO.455412

Pyroelectric detector-based method for low uncertainty spectral irradiance and radiance responsivity calibrations in the infrared using tunable lasers

Brian G. Alberding, John T. Woodward, Ping-Shine Shaw, Leonard M. Hanssen, Catherine C. Cooksey, and Joseph P. Rice

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Brian G. Alberding, John T. Woodward, Ping-Shine Shaw, Leonard M. Hanssen, Catherine C. Cooksey, and Joseph P. Rice, "Pyroelectric detector-based method for low uncertainty spectral irradiance and radiance responsivity calibrations in the infrared using tunable lasers," Appl. Opt. 61, 2957-2966 (2022)

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Abstract

The standard uncertainty of detector-based radiance and irradiance responsivity calibrations in the short-wave infrared (SWIR) traditionally has been limited to around 1% or higher by the poor spatial uniformity of detectors used to transfer the scale from radiant power. Pyroelectric detectors offer a solution that avoids the spatial uniformity uncertainty but also introduces additional complications due to alternating current (AC) measurement techniques. Herein, a new, to the best of our knowledge, method for low uncertainty irradiance responsivity calibrations in the SWIR is presented. An absolute spectral irradiance responsivity scale was placed on two pyroelectric detectors (PED) at wavelengths $\lambda$ from 500 to 3400 nm. The total combined uncertainty ($k = {{1}}$) was $\approx {0.28}\%$ (${\gt}{{1000}}\;{\text{nm}}$), 0.44% (900 nm), and 0.36% ($\approx {{950}}\;{\text{nm}}$ and ${\lt}{{900}}\;{\text{nm}}$) for PED #1 and 0.34% (${\gt}{{1000}}\;{\text{nm}}$), 0.48% (900 nm), and 0.42% ($\approx {{950}}\;{\text{nm}}$ and ${\lt}{{900}}\;{\text{nm}}$) for PED #2. This was done by utilizing a demodulation technique to digitally analyze the time-dependent AC waveforms, which obviates the use of lock-in amplifiers and avoids associated additional uncertainty components.

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Supplementary Material (1)

Name	Description
Supplement 1	Supplemental materials (Figures S1–S4)

Data availability

Data underlying the results presented in this paper are not publicly available at this time but may be obtained from the authors upon reasonable request.

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$A_{1}$	$0.93131 \pm 1.5 \times 1 0^{- 4}$
$A_{2}$	$0.95878 \pm 1.0 \times 1 0^{- 4}$
$x_{0, 1}$	$849.3 \pm 1.9 nm$
$x_{0, 2}$	$2298 \pm 15 nm$
$h_{1}$	$- 0.00414 \pm 5 \times 1 0^{- 5} / nm$
$h_{2}$	$- 9.1 \times 1 0^{- 4} \pm 4 \times 1 0^{- 5} / nm$
p	$0.696 \pm 0.008$
Reduced chi-squared	$9.6 \times 1 0^{- 8}$
$R^{2}$	0.996

	Trap		PED #1		PED #2
Parameter	Value	Fitting Uncertainty	Value	Fitting Uncertainty	Value	Fitting Uncertainty
$m_{1} / {mm}^{2}$	36210	23.8	2022.5	2.84	2420.6	9.81
$m_{2} / mm$	−794.8	0.112	−805.2	0.126	−806.8	0.369
$R^{2}$	1	N.A. ^b	1	N.A.	0.9999	N.A.
$d / mm$	291.3	0.038 %	301.6	0.042 %	303.2	0.12 %

	Relative Standard Uncertainty $(k = 1) / %$
Uncertainty Component	PED #1	PED #2
Irradiance cal. of reference trap detector	0.05	0.05
Percent st. dev of ratio tie points ^a	0.15	0.09
Distance ^b	0.114	0.256
Geometry alignment	0.05	0.05
Amplifier gain	N.A.	N.A.
Sphere aperture	N.A.	N.A.
Reference detector aperture	0.02	0.02
DUT aperture (pyro)	N.A.	N.A.
Wavelength	0.01	0.01
Absorptance percent st. dev (wavelength dependent)	0.1–0.36	0.1–0.36
Absorptance fit residual	0.1	0.1
Witness sample absorptance % difference (WL dependent)	0.05–0.13	0.05–0.13
Total combined uncertainty $(k = 1)$	0.28 ( $> 1000 n m$ ) 0.36 ( $\approx 950 n m$ and $< 900 n m$ ) 0.44 (900 nm)	0.34 ( $> 1000 n m$ ) 0.42 ( $\approx 950 n m$ and $< 900 n m$ ) 0.48 (900 nm)

$A_{1}$	$0.93131 \pm 1.5 \times 1 0^{- 4}$
$A_{2}$	$0.95878 \pm 1.0 \times 1 0^{- 4}$
$x_{0, 1}$	$849.3 \pm 1.9 nm$
$x_{0, 2}$	$2298 \pm 15 nm$
$h_{1}$	$- 0.00414 \pm 5 \times 1 0^{- 5} / nm$
$h_{2}$	$- 9.1 \times 1 0^{- 4} \pm 4 \times 1 0^{- 5} / nm$
p	$0.696 \pm 0.008$
Reduced chi-squared	$9.6 \times 1 0^{- 8}$
$R^{2}$	0.996

	Trap		PED #1		PED #2
Parameter	Value	Fitting Uncertainty	Value	Fitting Uncertainty	Value	Fitting Uncertainty
$m_{1} / {mm}^{2}$	36210	23.8	2022.5	2.84	2420.6	9.81
$m_{2} / mm$	−794.8	0.112	−805.2	0.126	−806.8	0.369
$R^{2}$	1	N.A. ^b	1	N.A.	0.9999	N.A.
$d / mm$	291.3	0.038 %	301.6	0.042 %	303.2	0.12 %

Brian G. Alberding	https://orcid.org/0000-0002-6313-1150
Catherine C. Cooksey	https://orcid.org/0000-0001-9411-6650

Abstract

Supplementary Material (1)

Data availability

Cited By

Figures (7)

Tables (3)

Equations (5)

Applied Optics