Abstract

Scanning of lightweight circular diffractive optics, separate from central stops and apertures, is emerging as an approach to exploit advances in synchrotron x-ray sources. We consider the effects in a scanning microscope of offsets between the optic and its central stop and find that scan ranges of up to about half the diameter of the optic are possible with only about a 10% increase in the focal spot width. For large scanning ranges, we present criteria for the working distance between the last aperture and the specimen to be imaged.

Tunable hard x-ray nanofocusing with Fresnel zone plates fabricated using deep etching

Kenan Li, Sajid Ali, Michael Wojcik, Vincent De Andrade, Xiaojing Huang, Hanfei Yan, Yong S. Chu, Evgeny Nazaretski, Ajith Pattammattel, and Chris Jacobsen
Optica 7(5) 410-416 (2020)

Effect of tilt on circular zone plate performance

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J. Opt. Soc. Am. A 37(3) 374-383 (2020)

Differential interference contrast x-ray microscopy with twin zone plates

Burkhard Kaulich, Thomas Wilhein, Enzo Di Fabrizio, Filippo Romanato, Matteo Altissimo, Stefano Cabrini, Barbara Fayard, and Jean Susini
J. Opt. Soc. Am. A 19(4) 797-806 (2002)

Diffracting aperture based differential phase contrast for scanning X-ray microscopy

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Opt. Express 10(20) 1111-1117 (2002)

Fast and easy fabrication methodology of Fresnel zone plates for the extreme ultraviolet and soft x-ray regions

A. Schümmer, H.-Ch. Mertins, Claus Michael Schneider, Roman Adam, Stefan Trellenkamp, Rene Borowski, Larissa Juschkin, and Ulf Berges
Appl. Opt. 58(4) 1057-1063 (2019)