Abstract

Amid the increasing potential of ultrafast mid-infrared (mid-IR) laser sources based on transition metal doped chalcogenides such as Cr:ZnS, Cr:ZnSe, and Fe:ZnSe lasers, there is a need for direct and sensitive characterization of mid-IR mode-locked laser pulses that work in the nanojoule energy range. We developed a two-dimensional spectral shearing interferometry (2DSI) setup to successfully demonstrate the direct electric-field reconstruction of Cr:ZnS mode-locked laser pulses with a central wavelength of 2.3 µm, temporal duration of 30.3 fs, and energies of 3 nJ. The reconstructed electric field is in reasonable agreement with an independently measured intensity autocorrelation trace, and the quantitative reliability of the 2DSI measurement is verified from a material dispersion evaluation. The presented implementation of 2DSI, including a choice of nonlinear crystal as well as the use of high-throughput dispersive elements and a high signal-to-noise ratio near-IR spectrometer, would benefit future development of ultrafast mid-IR lasers and their applications.

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