Compact lensless Fizeau holographic interferometry for imaging domain patterns in ferroelectric single crystals

Marek Mach; Marek Mach; Pavel Psota; Karel Žídek; Pavel Mokrý; Pavel Mokrý

doi:10.1364/AO.482379

Applied Optics
Vol. 62,
Issue 10,
pp. 2522-2530
(2023)
•https://doi.org/10.1364/AO.482379

Compact lensless Fizeau holographic interferometry for imaging domain patterns in ferroelectric single crystals

Marek Mach, Pavel Psota, Karel Žídek, and Pavel Mokrý

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Marek Mach, Pavel Psota, Karel Žídek, and Pavel Mokrý, "Compact lensless Fizeau holographic interferometry for imaging domain patterns in ferroelectric single crystals," Appl. Opt. 62, 2522-2530 (2023)

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Table of Contents Category
- Imaging Systems, Image Processing, and Displays
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About this Article
History
- Original Manuscript: December 1, 2022
- Revised Manuscript: February 27, 2023
- Manuscript Accepted: March 3, 2023
- Published: March 22, 2023

Abstract

Domain patterns in ferroelectric single crystals are physical systems that are fascinating from a theoretical point of view and essential for many applications. A compact lensless method for imaging domain patterns in ferroelectric single crystals based on a digital holographic Fizeau interferometer has been developed. This approach provides a large field-of-view image while maintaining a high spatial resolution. Furthermore, the double-pass approach increases the sensitivity of the measurement. The performance of the lensless digital holographic Fizeau interferometer is demonstrated by imaging the domain pattern in periodically poled lithium niobate. To display the domain patterns in the crystal, we have used an electro-optic phenomenon, which, when an external uniform electric field is applied to the sample, produces a difference in refractive index values in domains with different polarization states of the crystal lattice. Finally, the constructed digital holographic Fizeau interferometer is used to measure the difference in the index of refraction in the antiparallel ferroelectric domains in the external electric field. The lateral resolution of the developed method for ferroelectric domain imaging is discussed.

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Data underlying the results presented in this paper are not publicly available at this time but may be obtained from the authors upon reasonable request.

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Method	Sources	Resolution	Main resolution constraint	Measurement Area	Measurement time	Device dimensions
PFM	[20]	nanometer	radius of the tip	$100 µ m \times 100 µ m$	(2D) minutes	$250 \times 250 \times 300 {m m}^{3}$
SHG	[27]	lateral, axial $< 1 µ m$ [27]	MO 40x (NA 1.25; immersion oil), wavelength 900 nm	point-wise 80 MHz [27], galvanometric $x y z$ -scanner, $800 \times 800 µ m^{2}$	2D (s); 3D, depth scans (min)	$350 \times 350 \times 500 {m m}^{3}$
Raman OCM	[18,20,30]	lateral $< 500 n m$ [18,20], $< 2000 n m$ axial [18], 300 nm lateral, 500 nm axial [30]	MO 100x (NA 0,7), wavelength 532 nm	point-wise, positioning stage (2 nm resolution)	pinhole 75 µm, exp. time 0,2—0,77 s per point, [30]	$350 \times 350 \times 500 {m m}^{3}$
DHM conventional	[51]	lateral $µ m$ , wavefront deformation resolution 2 nm	MO; pixel size; wavelength	2D, camera sensor ( ${m m}^{2}$ )	2D, exp time; $< 1 s$ per frame	$350 \times 350 \times 500 {m m}^{3}$
DHM lens type	[34]	lateral 4 µm, wavefront deformation resolution 7 nm	MO 4x (NA 0,10); pixel size $2.2 µ m$ ; wavelength 532 nm	2D, camera sensor (5MPix) $1, 2 \times 1 {m m}^{2}$ ; 3D $1.5 \times 1.1 \times 1.2 {m m}^{3}$ ; rotating stage $< {0.1}^{\circ}$	2D, exp time; $< 1 s$ per frame; 3D, number of projections (min)	$450 \times 350 \times 250 {m m}^{3}$
DHI lens-free	[this paper]	lateral 10 µm, ^b wavefront deformation resolution 18 nm	distance 57.5 mm; pixel size $2, 2 µ m$ ; wavelength 631.52 nm	camera sensor (5MPix);	2D, exp time; $< 1 s$ per frame	$120 \times 80 \times 70 {m m}^{3}$

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Applied Optics