Abstract
For the modulation-based structured illumination microscopy system, how to obtain modulation distribution with an image has been a research hotspot. However, the existing frequency-domain single-frame algorithms (mainly including the Fourier transform method, wavelet method, etc.) suffer from different degrees of analytical error due to the loss of high-frequency information. Recently, a modulation-based spatial area phase-shifting method was proposed; it can obtain higher precision by retaining high-frequency information effectively. But for discontinuous (such as step) topography, it would be somewhat smooth. To solve the problem, we propose a high-order spatial phase shift algorithm that realizes robust modulation analysis of a discontinuous surface with a single-frame image. At the same time, this technique proposes a residual optimization strategy, so that it can be applied to the measurement of complex topography, especially discontinuous topography. Simulation and experimental results demonstrate that the proposed method can provide higher-precision measurement.
© 2023 Optica Publishing Group
Full Article | PDF ArticleMore Like This
Jinfeng Tang, Chenling Jia, Jin Zhang, Ming Jiang, Yangliu Pan, Siyue Jiang, Baoqing Hu, Qizhi Cao, and Mingwu Jin
Appl. Opt. 62(12) 3142-3148 (2023)
Zibang Zhang and Jingang Zhong
Opt. Express 22(3) 2695-2705 (2014)
Maciej Trusiak
Opt. Express 29(12) 18192-18211 (2021)