Abstract

We report the concept of a 1550 nm laser line scanning microscope based on a polydimethylsiloxane (PDMS) grating with scanning by stretching the PDMS grating to improve the scanning speed and enable low-cost scanning. Zemax is used to verify the possibility of realizing the system by simulating the illumination light path and the emission light path. The scanning field of view is ${0.11}\;{\rm mm} \times {0.11}\;{\rm mm}$, and the modulation transfer function (MTF) data of the 0th, $\pm {1}$st, and $\pm {2}$ nd diffraction orders in the illumination light path and the emission light path, respectively, meet the requirements of the diffraction limit resolution at the cutoff frequencies.

© 2023 Optica Publishing Group

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