Abstract

Silicon nanostructure colors have rapidly developed in recent years, offering high resolution and a broad color gamut that traditional pigments cannot achieve. The reflected colors of metasurfaces are determined by the geometric structure of the unit cell and the refractive index matching layer parameters. It is evident that the design of specific colors involves numerous parameters, making it challenging to achieve through conventional calculations. Therefore, the tandem network instead of conventional electromagnetic simulation is natural. The forward part of the network incorporates feature cross terms to improve accuracy, enabling high-precision predictions of structural colors based on structural parameters. The average color difference between the predicted and actual color values in the $L,a,b$ color space is 1.38. The network has been proven to accurately predict the refractive index and height of the refractive index matching layer during the dynamic tuning process. Additionally, the issue of the inverse network converging to incorrect solutions was addressed by leveraging the characteristics of the activation function. The results show that the color difference between the colors designed by the inverse network compared to the actual colors in the $L,a,b$ color spaces is only 2.22, which meets the requirements for commercial applications.

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