Abstract

An automated technique has been developed for the analysis of various types of interferograms. The technique makes use of a high speed digitized microdensitometer to scan the interferograms and a high speed computer to perform the required computations. The optical thickness variations for a test specimen can be determined by analysis of one or two interferograms. In addition, when required, determinations can be made of time change in optical thickness or the physical thickness and index of refraction homogeneity profiles by analysis of multiple interferograms.

© 1968 Optical Society of America

Automated interferogram analysis based on an integrated expert system

Wonjong Joo and Soyoung S. Cha
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Interferogram analysis using Fourier transform techniques

Claude Roddier and François Roddier
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Temporal phase-unwrapping algorithm for automated interferogram analysis

J. M. Huntley and H. Saldner
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Two-dimensional Fourier-transform techniques for the analysis of hook interferograms

H. J. Kim and B. W. James
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A Semiautomatic Method for Interpreting Shearing Interferograms

David Dutton, Alejandro Cornejo, and Milton Latta
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