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Principles and Applications of Emittance-Independent Infrared Nondestructive Testing

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Abstract

Three emittance-independent ir nondestructive testing techniques are described. Two of these use the dual scan ratio principle, and the other uses ir energy reflected from the test specimen surface to compensate for emittance differences. Complete details on the theory behind the three techniques are given-Instrumentation used to carry out tests and the results of two practical applications are described.

© 1968 Optical Society of America

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