Analysis of error propagation: from raw light-field data to depth estimation

Shengming Xu and Shengxian Shi

Appl. Opt. 62(33), 8704-8715 (2023)  View: HTML | PDF

MEMS-based portable confocal Raman spectroscopy rapid imaging system

Guozhuo Zhang, Xu Wang, Dezhi Zheng, Han Cui, and Yun Wang

Appl. Opt. 62(33), 8724-8731 (2023)  View: HTML | PDF

Inverse lithography physics-informed deep neural level set for mask optimization

Xing-Yu Ma and Shaogang Hao

Appl. Opt. 62(33), 8769-8779 (2023)  View: HTML | PDF

Efficient denoising of cold atom images using the optimized eigenface recognition algorithm

Gourab Pal and Saptarishi Chaudhuri

Appl. Opt. 62(33), 8786-8792 (2023)  View: HTML | PDF

High-precision surface profilometry on a micron-groove based on dual-comb electronically controlled optical sampling

Ziling Wu, Ameng Li, Rui Xue, Minglie Hu, and Youjian Song

Appl. Opt. 62(33), 8793-8797 (2023)  View: HTML | PDF

Improved STMask R-CNN-based defect detection model for automatic visual inspection of an optics lens

Haiyang Tang, Shan Liang, Dan Yao, and Yongjie Qiao

Appl. Opt. 62(33), 8869-8881 (2023)  View: HTML | PDF

Full-color optical combiner with good imaging quality and a wide angle of incident light acceptance

Fenglin Xi and Philip Bos

Appl. Opt. 62(33), 8918-8923 (2023)  View: HTML | PDF  [Suppl. Mat. (1)]