1 August 1992, Volume 31, Issue 22, pp. 4310-4602  
49 articles

Beam quality changes of Gaussian Schell-model fields propagating through Gaussian apertures

Appl. Opt. 31(22), 4330-4331 (1992)  View: HTML | PDF

New behavior in nonideal couplers

Appl. Opt. 31(22), 4332-4334 (1992)  View: HTML | PDF

Real-time measurement of surface roughness through Young’s fringes modulated speckle

Appl. Opt. 31(22), 4334-4336 (1992)  View: HTML | PDF

Ultranarrow filters with good performance when tilted and cooled

Appl. Opt. 31(22), 4336-4338 (1992)  View: HTML | PDF

Self-aligning optical measurement systems

Appl. Opt. 31(22), 4339-4340 (1992)  View: HTML | PDF

Polarization-preserving totally reflecting prisms

Appl. Opt. 31(22), 4340-4342 (1992)  View: HTML | PDF

Infrared optical characteristics of type 2A diamonds: erratum

Appl. Opt. 31(22), 4342-4342 (1992)  View: HTML | PDF

Extending the caustic test to general aspheric surfaces

Appl. Opt. 31(22), 4343-4349 (1992)  View: HTML | PDF

Testing spherical surfaces: a fast, quasi-absolute technique

Appl. Opt. 31(22), 4350-4354 (1992)  View: HTML | PDF

Direct contact superpolishing of sapphire

Appl. Opt. 31(22), 4355-4362 (1992)  View: HTML | PDF

Improved wedge-plate shearing interferometric technique for a collimation test

Appl. Opt. 31(22), 4363-4364 (1992)  View: HTML | PDF

Self-directioning with the revolving retroreflection technique

Appl. Opt. 31(22), 4365-4370 (1992)  View: HTML | PDF

Antireflection surfaces in silicon using binary optics technology

Appl. Opt. 31(22), 4371-4376 (1992)  View: HTML | PDF

Two-mirror unobscured optical system for reshaping the irradiance distribution of a laser beam

Appl. Opt. 31(22), 4377-4383 (1992)  View: HTML | PDF

Prime focus correctors for the spherical mirror

Appl. Opt. 31(22), 4384-4388 (1992)  View: HTML | PDF

Effects of diffraction efficiency on the modulation transfer function of diffractive lenses

Appl. Opt. 31(22), 4389-4396 (1992)  View: HTML | PDF

Fused-silica focusing lens for deep UV laser processing

Appl. Opt. 31(22), 4397-4404 (1992)  View: HTML | PDF

High-resolution ground-based coronagraphy using image-motion compensation

Appl. Opt. 31(22), 4405-4416 (1992)  View: HTML | PDF

Polarization-interference measurement of phase-inhomogeneous objects

Appl. Opt. 31(22), 4417-4419 (1992)  View: HTML | PDF

Sensitivity of the reflection technique: optimum angles of incidence to determine the optical properties of materials

Appl. Opt. 31(22), 4420-4427 (1992)  View: HTML | PDF

Coherent gradient sensing: a Fourier optics analysis and applications to fracture

Appl. Opt. 31(22), 4428-4439 (1992)  View: HTML | PDF

Beam-jitter measurements of turbulent aero-optical path differences

Appl. Opt. 31(22), 4440-4443 (1992)  View: HTML | PDF

Binary gratings with increased efficiency

Appl. Opt. 31(22), 4453-4458 (1992)  View: HTML | PDF

Jones matrix for round-trip wave propagation in nonreciprocal media

Appl. Opt. 31(22), 4471-4473 (1992)  View: HTML | PDF

Method for the determination of optical constants of thin films: dependence on experimental uncertainties

Appl. Opt. 31(22), 4474-4481 (1992)  View: HTML | PDF

Simultaneous measurement of the refractive index and thickness of thin films by S-polarized reflectances

Appl. Opt. 31(22), 4482-4487 (1992)  View: HTML | PDF

Infrared radiation and reflection in an inhomogeneous coating layer on a substrate

Appl. Opt. 31(22), 4488-4496 (1992)  View: HTML | PDF

Numerical inverse method of determining film parameters of uniaxial anisotropic film with an ellipsometer

Appl. Opt. 31(22), 4497-4500 (1992)  View: HTML | PDF

Transmitted and tuning characteristics of birefringent filters

Appl. Opt. 31(22), 4505-4508 (1992)  View: HTML | PDF

Observations of winds with an incoherent lidar detector

Appl. Opt. 31(22), 4509-4514 (1992)  View: HTML | PDF

Scanning Wiener-fringe microscope with an optical fiber tip

Appl. Opt. 31(22), 4515-4518 (1992)  View: HTML | PDF

Two-wavelength electronic speckle-pattern interferometry for the analysis of discontinuous deformation fields

Appl. Opt. 31(22), 4519-4521 (1992)  View: HTML | PDF

Measurement of the changes in air refractive index and distance by means of a two-color interferometer

Appl. Opt. 31(22), 4522-4526 (1992)  View: HTML | PDF

Calibration of a Fourier transform spectrometer using three blackbody sources

Appl. Opt. 31(22), 4527-4533 (1992)  View: HTML | PDF

Distribution of zero crossings for the profile of random rough surfaces

Appl. Opt. 31(22), 4534-4539 (1992)  View: HTML | PDF

Achromatic holographic configuration for 100-nm-period lithography

Appl. Opt. 31(22), 4540-4545 (1992)  View: HTML | PDF

Principal optical constants measurement of uniaxial crystal CdSe in the wavelength region between 380 and 950 nm

Appl. Opt. 31(22), 4546-4552 (1992)  View: HTML | PDF

Refractive index of crystals from transmission and reflection measurements: MgO in the far-infrared region

Appl. Opt. 31(22), 4554-4558 (1992)  View: HTML | PDF

Estimating the thermal conductivity of magneto-optical recording media

Appl. Opt. 31(22), 4559-4562 (1992)  View: HTML | PDF

Polarization contrast in near-field scanning optical microscopy

Appl. Opt. 31(22), 4563-4568 (1992)  View: HTML | PDF

Surface profiling with scanning optical microscopes using two-mode optical fibers

Appl. Opt. 31(22), 4569-4574 (1992)  View: HTML | PDF

Edge-setting criterion in confocal microscopy

Appl. Opt. 31(22), 4575-4577 (1992)  View: HTML | PDF

Effect of phasing-sector angular extent in FM reticles

Appl. Opt. 31(22), 4578-4581 (1992)  View: HTML | PDF

Reflection and transmission measurements with an integrating sphere and Fourier-transform infrared spectrometer

Appl. Opt. 31(22), 4582-4589 (1992)  View: HTML | PDF

CO2 lidar backscatter profiles over Hawaii during fall 1988

Appl. Opt. 31(22), 4590-4599 (1992)  View: HTML | PDF

Zero axial irradiance by annular screens with angular variation

Appl. Opt. 31(22), 4600-4602 (1992)  View: HTML | PDF