Patent Reviews: 5,278,532; 5,287,213; 5,293,271; 5,293,272; 5,295,014; 5,296,689; 5,296,958; 5,298,972; 5,299,062

B. J. Howell

Appl. Opt. 33(25), 5851-5852 (1994)  View: PDF

Optical profile of surface layers on a float glass determined by ellipsometry

B. Dugnoille and O. Virlet

Appl. Opt. 33(25), 5853-5858 (1994)  View: HTML | PDF

Remote sensing of wind velocity and strength of refractive turbulence using a two-spatial-filter receiver

Steen G. Hanson, James H. Churnside, and James J. Wilson

Appl. Opt. 33(25), 5859-5868 (1994)  View: HTML | PDF

Platinum/carbon multilayer reflectors for soft-x-ray optics

G. S. Lodha, K. Yamashita, T. Suzuki, I. Hatsukade, K. Tamura, T. Ishigami, S. Takahama, and Y. Namba

Appl. Opt. 33(25), 5869-5874 (1994)  View: HTML | PDF

Design and characterization of coherent integrated fiber-optic imaging probes

Romel R. Khan, Harbans S. Dhadwal, and Kwang Suh

Appl. Opt. 33(25), 5875-5881 (1994)  View: HTML | PDF

Influence of high temperatures on a fiber-optic probe for temperature measurement

E. Milcent, G. Olalde, J. F. Robert, D. Hernandez, and M. Clement

Appl. Opt. 33(25), 5882-5887 (1994)  View: HTML | PDF

Quantitative evaluation of chalcogenide glass fiber evanescent wave spectroscopy

M. Katz, A. Katzir, I. Schnitzer, and A. Bornstein

Appl. Opt. 33(25), 5888-5894 (1994)  View: HTML | PDF

Color modulation properties of a liquid-crystal device

Kazunobu Ohkubo, Junji Ohtsubo, and Naoki Izumi

Appl. Opt. 33(25), 5895-5901 (1994)  View: HTML | PDF

Effect of energetic electron and proton bombardment on the reflectance of silicon-carbide mirrors in the extreme-ultraviolet region

G. E. Holland, J. F. Seely, R. P. McCoy, K. F. Dymond, C. Rollins, and M. Corson

Appl. Opt. 33(25), 5902-5905 (1994)  View: HTML | PDF

Effect of spatial coherence on knife-edge measurements of detector modulation transfer function

Miles N. Wernick and G. Michael Morris

Appl. Opt. 33(25), 5906-5913 (1994)  View: HTML | PDF

Transmission trap detectors

James L. Gardner

Appl. Opt. 33(25), 5914-5918 (1994)  View: HTML | PDF

Index-distributed planar microlenses for three-dimensional micro-optics fabricated by silver-sodium ion exchange in BGG35 substrates

J. Bähr, K.-H. Brenner, S. Sinzinger, T. Spick, and M. Testorf

Appl. Opt. 33(25), 5919-5924 (1994)  View: HTML | PDF

Multilevel phase gratings for array illuminators

Victor Arrizón and J. Ojeda-Castañeda

Appl. Opt. 33(25), 5925-5931 (1994)  View: HTML | PDF

Modified holographic recording setup for photopolymerizable/flexible recording materials

Guylain Lemelin, Gurusamy Manivannan, and Roger A. Lessard

Appl. Opt. 33(25), 5932-5934 (1994)  View: HTML | PDF

Use of the fast Fourier transform method for analyzing linear and equispaced Fizeau fringes

Guanming Lai and Toyohiko Yatagai

Appl. Opt. 33(25), 5935-5940 (1994)  View: HTML | PDF

Integrated optical Young interferometer

A. Brandenburg and R. Henninger

Appl. Opt. 33(25), 5941-5947 (1994)  View: HTML | PDF

Extending the unambiguous range of two-color interferometers

Peter J. de Groot

Appl. Opt. 33(25), 5948-5953 (1994)  View: HTML | PDF

New integrated-optics interferometer in planar technology

Isabelle Schanen Duport, Pierre Benech, and Roger Rimet

Appl. Opt. 33(25), 5954-5958 (1994)  View: HTML | PDF

Object illumination angle measurement in speckle interferometry

T. W. Ng and F. S. Chau

Appl. Opt. 33(25), 5959-5961 (1994)  View: HTML | PDF

Ion-beam-deposited boron carbide coatings for the extreme ultraviolet

G. M. Blumenstock and Ritva A. M. Keski-Kuha

Appl. Opt. 33(25), 5962-5963 (1994)  View: HTML | PDF

Digital processing of electronic speckle pattern interferometry addition fringes

A. Davila, D. Kerr, and G. H. Kaufmann

Appl. Opt. 33(25), 5964-5969 (1994)  View: HTML | PDF

Compact dielectric reflective elements. I. Half-sphere concentrators of radially emitted light

Janis Spigulis

Appl. Opt. 33(25), 5970-5974 (1994)  View: HTML | PDF

Reststrahlen band studies of polycrystalline beryllium oxide

Teddy Chibuye, Carl G. Ribbing, and Ewa Wäckelgård

Appl. Opt. 33(25), 5975-5981 (1994)  View: HTML | PDF

Mueller matrix analysis of infrared ellipsometry

Erik Wold and Johannes Bremer

Appl. Opt. 33(25), 5982-5993 (1994)  View: HTML | PDF

Measuring distribution of the ellipsoid of birefringence through the thickness of optical disk substrates

Hong Fu, Satoshi Sugaya, and M. Mansuripur

Appl. Opt. 33(25), 5994-5998 (1994)  View: HTML | PDF

Effect of tilted ellipsoid of birefringence on readout signal in magneto-optical disk data storage

Satoshi Sugaya and M. Mansuripur

Appl. Opt. 33(25), 5999-6008 (1994)  View: HTML | PDF

Polarized light reflectometer

R. M. A. Azzam

Appl. Opt. 33(25), 6009-6011 (1994)  View: HTML | PDF

Reflector design for illumination with extended sources: the basic solutions

A. Rabl and J. M. Gordon

Appl. Opt. 33(25), 6012-6021 (1994)  View: HTML | PDF

Infrared radiance and solar glint at the ocean–sky horizon

M. D. Mermelstein, E. P. Shettle, E. H. Takken, and R. G. Priest

Appl. Opt. 33(25), 6022-6034 (1994)  View: HTML | PDF

Single-pulse, Fourier-transform spectrometer having no moving parts

M. J. Padgett, A. R. Harvey, A. J. Duncan, and W. Sibbett

Appl. Opt. 33(25), 6035-6040 (1994)  View: HTML | PDF

Radiation damage effects in far-ultraviolet filters, thin films, and substrates

Charles E. Keffer, Marsha R. Torr, Muamer Zukic, James F. Spann, Douglas G. Torr, and Jongmin Kim

Appl. Opt. 33(25), 6041-6045 (1994)  View: HTML | PDF

Resonant metal-mesh bandpass filters for the far infrared

D. W. Porterfield, J. L. Hesler, R. Densing, E. R. Mueller, T. W. Crowe, and R. M. Weikle

Appl. Opt. 33(25), 6046-6052 (1994)  View: HTML | PDF

Optical functions of transparent thin films of SrTiO₃, BaTiO₃, and SiOx determined by spectroscopic ellipsometry

G. E. Jellison, L. A. Boatner, D. H. Lowndes, R. A. McKee, and M. Godbole

Appl. Opt. 33(25), 6053-6058 (1994)  View: HTML | PDF

Automatic three-dimensional spectrogoniometer for determination of optical properties and surface parameters

J. C. Martínez-Antón and E. Bernabeu

Appl. Opt. 33(25), 6059-6061 (1994)  View: HTML | PDF

Mirror system for collecting Thomson-scattered light in a tangential direction

C. J. Barth, B. J. J. Grobben, and G. C. H. M. Verhaag

Appl. Opt. 33(25), 6062-6067 (1994)  View: HTML | PDF

Talbot interferometer with circular gratings for the measurement of temperature in axisymmetric gaseous flames

Chandra Shakher and A. J. Pramila Daniel

Appl. Opt. 33(25), 6068-6072 (1994)  View: HTML | PDF

Slow-flow measurements and fluid dynamics analysis using the Fresnel drag effect

R. T. de Carvalho and J. Blake

Appl. Opt. 33(25), 6073-6077 (1994)  View: HTML | PDF

Cross-sensitivity effect in temperature-compensated sensors based on highly birefringent fibers

Wojtek J. Bock, Waclaw Urbanczyk, Ryszard Buczynski, and Andrzej W. Domanski

Appl. Opt. 33(25), 6078-6083 (1994)  View: HTML | PDF

Rayleigh scattering limits for low-level bidirectional reflectance distribution function measurements

C. Asmail, J. Hsia, A. Parr, and J. Hoeft

Appl. Opt. 33(25), 6084-6091 (1994)  View: HTML | PDF

Stray-light corrections in integrating-sphere measurements on low-scattering samples

Daniel Rönnow and Arne Roos

Appl. Opt. 33(25), 6092-6097 (1994)  View: HTML | PDF

Evaluation of correction factors for transmittance measurements in single-beam integrating spheres

K. Grandin and A. Roos

Appl. Opt. 33(25), 6098-6104 (1994)  View: HTML | PDF

Characterization of the scattering properties of a mirror by speckle-field statistics

Vincenzo Greco, Giuseppe Molesini, and Franco Quercioli

Appl. Opt. 33(25), 6105-6110 (1994)  View: HTML | PDF

Reciprocal reflection interferometer for a fiber-optic Faraday current sensor

Guido Frosio and René Dändliker

Appl. Opt. 33(25), 6111-6122 (1994)  View: HTML | PDF