Patent Reviews: 6,246,481; 6,246,823; 6,256,096; 6,265,705; 6,268,910; 6,278,521; 6,285,448; 6,285,452; 6,301,416; 6,307,634; 6,307,636; 6,313,914; 6,313,915; 6,316,764; 6,320,196

A. Brunsting, V. Amirkhanian, P. Baumeister, G. E. Cohn, S. Daniels, J. A. Decker, D. S. Fisher, E. S. Gaynor, R. L. Hilliard, B. A. Horwitz, K. K. Lee, W.-H. Lee, E. G. Loewen, B. R. Masters, H. Miranda, G. L. Mitchell, A. Parretta, D. C. Rich, H. B. Schall, M. J. Simpson, W. H. Stevenson, S. N. Thennadil, S.-M. Tseng, A. Walczak, W. J. Walecki, R. H. Webb, and H. Zhao

Appl. Opt. 41(13), 2377-2380 (2002)  View: PDF

Wind-induced deformations in a segmented mirror

Stephen Padin

Appl. Opt. 41(13), 2381-2389 (2002)  View: HTML | PDF

High-efficiency blazed diffractive optical elements for the violet wavelength fabricated by electron-beam lithography

Teruhiro Shiono, Tetsuya Hamamoto, and Koji Takahara

Appl. Opt. 41(13), 2390-2393 (2002)  View: HTML | PDF

Performance of normal-incidence molybdenum-yttrium multilayer-coated diffraction grating at a wavelength of 9 nm

Benjawan Sae-Lao, Saša Bajt, Claude Montcalm, and John F. Seely

Appl. Opt. 41(13), 2394-2400 (2002)  View: HTML | PDF

Simultaneous determination of curvature, plane of curvature, and temperature by use of a miniaturized sensing head based on fiber Bragg gratings

F. M. Araújo, L. A. Ferreira, and J. L. Santos

Appl. Opt. 41(13), 2401-2407 (2002)  View: HTML | PDF

Analysis of Seidel aberration by use of the discrete wavelet transform

Rong-Seng Chang, Jin-Yi Sheu, and Ching-Huang Lin

Appl. Opt. 41(13), 2408-2413 (2002)  View: HTML | PDF

Geometrical tomographic imaging of refractive indices through turbid media by a wavelength-scanning heterodyne interference confocal microscope

Yuuki Watanabe and Ichirou Yamaguchi

Appl. Opt. 41(13), 2414-2419 (2002)  View: HTML | PDF

Characterization of a CCD-based digital x-ray imaging system for small-animal studies: properties of spatial resolution

Fabrice Ouandji, Eric Potter, Wei R. Chen, Yuhua Li, David Tang, and Hong Liu

Appl. Opt. 41(13), 2420-2427 (2002)  View: HTML | PDF

Polarization-dependent angular-optical reflectance in solar-selective SnO_x:F/Al₂O₃/Al reflector surfaces

Mghendi Mwamburi, Ewa Wäckelgård, Arne Roos, and Rogath Kivaisi

Appl. Opt. 41(13), 2428-2434 (2002)  View: HTML | PDF

Tilt-compensating algorithm for phase-shift interferometry

Adrian Dobroiu, Dan Apostol, Victor Nascov, and Victor Damian

Appl. Opt. 41(13), 2435-2439 (2002)  View: HTML | PDF

Dual-wave-front computer-generated holograms for quasi-absolute testing of aspherics

Mathias Beyerlein, Norbert Lindlein, and Johannes Schwider

Appl. Opt. 41(13), 2440-2447 (2002)  View: HTML | PDF

Grating-based real-time polarization phase-shifting interferometry: error analysis

Qian Kemao, Wu Xiaoping, and Anand Asundi

Appl. Opt. 41(13), 2448-2453 (2002)  View: HTML | PDF

Real-time speckle interferometry fringe formation with an adaptive phase mask

Yuji Shen, Noe Alcala Ochoa, and Jonathan M. Huntley

Appl. Opt. 41(13), 2454-2460 (2002)  View: HTML | PDF

Stabilization by harmonic intensities for the output signal in heterodyne detection

Manabu Sato and Naohiro Tanno

Appl. Opt. 41(13), 2461-2469 (2002)  View: HTML | PDF

Design of a broadband UV-visible α-barium borate polarizer

Roland Appel, Chris D. Dyer, and John N. Lockwood

Appl. Opt. 41(13), 2470-2480 (2002)  View: HTML | PDF

Phase anomalies in Fourier-transform spectrometers: an absorbing beam splitter is neither sufficient nor necessary

John C. Brasunas

Appl. Opt. 41(13), 2481-2487 (2002)  View: HTML | PDF

Optimization of a dual-rotating-retarder Mueller matrix polarimeter

Matthew H. Smith

Appl. Opt. 41(13), 2488-2493 (2002)  View: HTML | PDF

Trapping forces, force constants, and potential depths for dielectric spheres in the presence of spherical aberrations

Alexander Rohrbach and Ernst H. K. Stelzer

Appl. Opt. 41(13), 2494-2507 (2002)  View: HTML | PDF

Absolute refractive indices and thermal coefficients of CaF₂, SrF₂, BaF₂, and LiF near 157 nm

John H. Burnett, Rajeev Gupta, and Ulf Griesmann

Appl. Opt. 41(13), 2508-2513 (2002)  View: HTML | PDF

Surface plasmon resonance sensor using an optical fiber with an inverted graded-index profile

Fabrice Bardin, Ivan Kašík, Alain Trouillet, Vlastimil Matějec, Henri Gagnaire, and Mirek Chomát

Appl. Opt. 41(13), 2514-2520 (2002)  View: HTML | PDF

Matrix description of coherent and incoherent light reflection and transmission by anisotropic multilayer structures

Kamil Postava, Tomuo Yamaguchi, and Roman Kantor

Appl. Opt. 41(13), 2521-2531 (2002)  View: HTML | PDF

Optical properties and quantum efficiency of thin-film alkali halides in the far ultraviolet

Juan I. Larruquert, José A. Méndez, José A. Aznárez, Anton S. Tremsin, and Oswald H. W. Siegmund

Appl. Opt. 41(13), 2532-2540 (2002)  View: HTML | PDF

Detection of bacterial infection of agave plants by laser-induced fluorescence

Jesús Cervantes-Martínez, Ricardo Flores-Hernández, Benjamín Rodríguez-Garay, and Fernando Santacruz-Ruvalcaba

Appl. Opt. 41(13), 2541-2545 (2002)  View: HTML | PDF

Index determination of opaque and semitransparent metallic films: application to light absorbers

Michel Cathelinaud, Frédéric Lemarquis, and Claude Amra

Appl. Opt. 41(13), 2546-2554 (2002)  View: HTML | PDF

Effect of systematic errors in spectral photometric data on the accuracy of determination of optical parameters of dielectric thin films

Alexander V. Tikhonravov, Michael K. Trubetskov, Michael A. Kokarev, Tatiana V. Amotchkina, Angela Duparré, Etienne Quesnel, Detlev Ristau, and Stefan Günster

Appl. Opt. 41(13), 2555-2560 (2002)  View: HTML | PDF

SPIFI: a direct-detection imaging spectrometer for submillimeter wavelengths

C. Matt Bradford, Gordon J. Stacey, Mark R. Swain, Thomas Nikola, Alberto D. Bolatto, James M. Jackson, Maureen L. Savage, Jacqueline A. Davidson, and Peter A. R. Ade

Appl. Opt. 41(13), 2561-2574 (2002)  View: HTML | PDF

Patterning flood illumination with microlens arrays

Ming-Hsien Wu, Kateri E. Paul, and George M. Whitesides

Appl. Opt. 41(13), 2575-2585 (2002)  View: HTML | PDF

Tolerance on defocus precisely locates the far field (exactly where is that far field anyway?)

James E. Harvey, Andrey Krywonos, and Dijana Bogunovic

Appl. Opt. 41(13), 2586-2588 (2002)  View: HTML | PDF

Polarization-mode dispersion measurements in high-birefringence fibers by means of stimulated raman scattering

Guy Millot and John M. Dudley

Appl. Opt. 41(13), 2589-2591 (2002)  View: HTML | PDF

Analytical study of the principal angle used in optical experiments

Xiao-Song Zhu, Hai-Bing Zhao, Rong-Jun Zhang, Yun-Shen Ma, Zhu Liu, Jing Li, Zuo-Chen Shen, Song-You Wang, and Liang-Yao Chen

Appl. Opt. 41(13), 2592-2595 (2002)  View: HTML | PDF