10 December 2009, Volume 48, Issue 35, pp. 6594-6840
28 articles
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The characters in these noisy wafer ID images could be well segmented out by a series of image processing techniques. Image localization, image enhancement, image binarization, skew correction, image segmentation, etc. are included in these techniques. For details see Yu et al., pp. 6606-6620.
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