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10 May 2022, Volume 61, Issue 14, pp. 3912-4225  
40 articles

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Study on total reflection performance of films grown by atomic layer deposition relevant to X-ray reflective optics

Yanli Li, Weier Lu, Xinyue Zhang, Xiangdong Kong, Fei Qu, and Li Han

Appl. Opt. 61(14), 3934-3938 (2022)  View: HTML | PDF

Terahertz device utilizing a transmissive geometric metasurface

Jiu-Sheng Li and Yi Chen

Appl. Opt. 61(14), 4140-4144 (2022)  View: HTML | PDF

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Sample glass blocks and position of each measurement for wavefront phase measurement of striae. For details, see Trujillo-Sevilla et al., pp. 3912–3918.

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