Abstract

Several techniques have been previously described for the x-ray examination of compounds that cannot be exposed to the atmosphere. However, most of these devises are unsuitable for a geiger type x-ray diffraction spectrometer, and their usefulness is limited to equipment utilizing cameras. A very convenient and inexpensive sealed sample holder, which is described in this paper, is based upon the large specimen area available in a focusing camera and geiger type spectrometer, and which can be successfully employed to either prevent sample exposure to the atmosphere or provide a special atmosphere to the sample for chemical studies.

Examination of Surfaces by X-Ray Reflection*

R. H. Buteux
J. Opt. Soc. Am. 43(7) 618-618 (1953)

A Study in Diffraction Microscopy with Special Reference to X-Rays

Albert V. Baez
J. Opt. Soc. Am. 42(10) 756-762 (1952)

Surface finish requirements for soft x-ray mirrors

D. L. Windt, W. K. Waskiewicz, and J. E. Griffith
Appl. Opt. 33(10) 2025-2031 (1994)

Miniaturized compound refractive X-ray zoom lens

E. Kornemann, O. Márkus, A. Opolka, T. Zhou, I. Greving, M. Storm, C. Krywka, A. Last, and J. Mohr
Opt. Express 25(19) 22455-22466 (2017)

X-ray ultramicroscopy using integrated sample cells

Dachao Gao, Stephen W. Wilkins, David J. Parry, Tim E. Gureyev, Peter R. Miller, and Eric Hanssen
Opt. Express 14(17) 7889-7894 (2006)