Abstract

Various devices are used to reduce the labor of calculating the concentrations of components with mutually interfering bands in quantitative infrared analysis. Computers <i>(7)</i> or IBM equipment <i>(8,10)</i> may be used for complex systems, or successive approximation methods <i>(3,5,11)</i> may be satisfactory. For systems of two or three components, exact solutions can be obtained by solving simultaneous equations <i>(4,6),</i> but such a procedure becomes tedious when large numbers of samples are involved. It is the purpose of this note to point out that nomographs can be easily constructed which give exact solutions to these simultaneous equations with a minimum of effort. Several forms of nomographs have been suggested for this purpose <i>(2,9,12),</i> but the type described here seems to offer some advantages in ease of construction and use.

Measurement of Cell Thickness in Infrared Spectrophotometry

Giorgio Gambirasio
Appl. Opt. 6(3) 477-480 (1967)

An Intensity-Compensating System for Infrared Spectrophotometry

H. M. Richardson, R. G. Fowler, and M. L. Coffman
J. Opt. Soc. Am. 43(10) 873-876 (1953)

Nomograph for the Calculation of the Index of Refraction of a Prism

Adam Zanker
Appl. Opt. 13(11) 2449-2449 (1974)

Film Thickness Measurements for Infrared Spectrophotometry

J. H. Peterson and J. R. Downing
J. Opt. Soc. Am. 41(11) 862_2-863 (1951)

Use of an optical multichannel analyzer in spectrophotometry

Zhen Hua Wang and David R. McKenzie
Appl. Opt. 27(23) 4960-4963 (1988)