Abstract

In the qualitative x-ray fluorescence analysis of materials, this laboratory is frequently confronted with the comparison and subsequent identification of numerous samples. Each such identification, whether by calculation or tables of wavelengths, is time-consuming. The use of a transparent overlay with appropriate scale factors has provided a valuable short cut.

Molecular Emission Spectra in the Soft X-Ray Region

Richard D. Deslattes and Robert E. LaVilla
Appl. Opt. 6(1) 39-42 (1967)

Thermoluminescence Spectra of X-Ray Colored KCl Crystals

A. Halperin and N. Kristianpoller
J. Opt. Soc. Am. 48(12) 996-1000 (1958)

X-ray calibration of Kodak Direct Exposure film

P. D. Rockett, C. R. Bird, C. J. Hailey, D. Sullivan, D. B. Brown, and P. G. Burkhalter
Appl. Opt. 24(16) 2536-2542 (1985)

Direct measure of the phase shift of an x-ray beam

T. J. Davis and A. W. Stevenson
J. Opt. Soc. Am. A 13(6) 1193-1198 (1996)

Direct recording and reconstruction of 3-D x-ray images

J. Hamasaki and K. Yokota
Appl. Opt. 17(19) 3125-3132 (1978)