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Optica Publishing Group
  • Applied Spectroscopy
  • Vol. 20,
  • Issue 1,
  • pp. 18-25
  • (1966)

Spectroscopic Investigations of Some Halide Reactions in Plasma-Generating Devices

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Abstract

The behaviors of some halides of carbon (CF<sub>4</sub>, CCl<sub>4</sub>, CF<sub>3</sub>Cl, and Teflon), silicon (SiF<sub>4</sub> and SiCl<sub>4</sub>), and boron (BF<sub>3</sub>) in plasma reactors have been investigated by emission spectroscopy. The emission spectra from these compounds have been identified and arise from excited diatomic molecules SiF, SiO, BO, C<sub>2</sub>, and CN and excited atoms of Si, B, and C. On the basis of the observed spectra and energetic and thermodynamic arguments, it is concluded that dissociation, excitation, and/or ionization processes requiring 25–30 eV are predominant in the plasma reactors under the experimental conditions of these studies.

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