Abstract

To minimize the error caused by cell thickness changes, we have made it a practice to recalibrate our cells frequently by scanning ten to twenty interference fringes in triplicate and calculating the thickness from the equation <i>t</i>=<i>n</i>/2(f₁-f₂). (1) This was a costly operation, and it occurred to us that, since the interference pattern is a function of cell thickness, the frequencies at which the transmission maxima occur are also functions of the cell thickness. Thus we should be able to measure the cell thickness from the transmission maximum of a single interference fringe.

Interferometric Frequency Calibration of Infrared Spectrometers

Svend Brodersen
J. Opt. Soc. Am. 46(4) 255-258 (1956)

The Calibration of Infrared Prism Spectrometers

A. R. Downie, M. C. Magoon, Thomasine Purcell, and Bryce Crawford
J. Opt. Soc. Am. 43(11) 941-951 (1953)

Measurement of Cell Thickness in Infrared Spectrophotometry

Giorgio Gambirasio
Appl. Opt. 6(3) 477-480 (1967)

A Method of Calibrating an Infrared Prism Spectrometer*†

W. L. Ross and D. E. Little
J. Opt. Soc. Am. 41(12) 1006-1010 (1951)

Calibration of Infrared Prism Spectrometers*

A. S. Filler and L. Indyk
J. Opt. Soc. Am. 51(5) 572-574 (1961)