Abstract

Various possibilities of Auger and photoelectron spectroscopy as an analytical technique are discussed. In some applications simple electrostatic analyzers with coarse resolution may suffice and even be preferable. Typical spectra obtained with a hemispherical electrostatic analyzer of 0.6% energy resolution are presented and discussed. Such factors as sample thickness, sample potential, surface contamination, and incident angle of the exciting x rays have been found to affect the quality and character of the observed spectra. These results characterize some of the features, problems, and capabilities of applied Auger and photoelectron spectroscopy.

Coherent optical 2D photoelectron spectroscopy

Daniel Uhl, Ulrich Bangert, Lukas Bruder, and Frank Stienkemeier
Optica 8(10) 1316-1324 (2021)

Discharge Emission Identification by Photoelectron Spectroscopy

J. C. Steichen and J. L. Franklin
Appl. Opt. 12(8) 1971-1975 (1973)

Laser based soft-x-ray pulses for photoelectron spectroscopy of surfaces

G. Tsilimis, C. Benesch, J. Kutzner, and H. Zacharias
J. Opt. Soc. Am. B 20(1) 246-253 (2003)

Auger electron spectroscopy for surface ferroelectric domain differentiation in selectively poled MgO:LiNbO₃

Torrey McLoughlin, Wm. Randall Babbitt, Phillip A. Himmer, and Wataru Nakagawa
Opt. Mater. Express 10(10) 2379-2393 (2020)

Branching Ratios in Photoelectron Spectroscopy*

James A. R. Samson and J. L. Gardner
J. Opt. Soc. Am. 62(7) 856-858 (1972)