Abstract

A new digital computational method of spectral line shape analysis is reported. In the present method, the parameters of object functions are directly found to fit the experimental values on the basis of a nonlinear least squares method. The present method is available for curve fitting of experimental results if the functions are expressed in analytical form. As an example, the results of resolving the recorded Raman spectra into the component line shapes is presented. The agreement of the recorded Raman spectra with that composed of the resolved lines is excellent.

Mathematical Resolution of Overlapping Spectral Lines

Henry Stone
J. Opt. Soc. Am. 52(9) 998-1003 (1962)

Computer Analysis of Resonance Profiles by the Method of Least Squares

David L. Ederer
Appl. Opt. 8(11) 2315-2325 (1969)

A Spectral Line Discriminator Interferometer: an Analysis

Charles T. Foskett and J. Morris Weinberg
Appl. Opt. 8(11) 2185-2190 (1969)

Analysis of Atomic Spectra with Electronic Digital Computers

K. G. Kessler, S. B. Prusch, and I. A. Stegun
J. Opt. Soc. Am. 46(12) 1043-1045 (1956)

New approximation to the Voigt function with applications to spectral-line profile analysis

John F. Kielkopf
J. Opt. Soc. Am. 63(8) 987-995 (1973)