Abstract

A powdered semiconductor (ZnO) and a polycrystalline sample of perovskite-type LaAlO₃ doped with 1% Cr(III) have been subjected to the recently developed technique of diffuse reflectance flash photolysis. In both cases transient absorption spectra are obtained from these powdered, nontransparent samples and these are reported here. Thus, the method allows the direct observation of absorption by transient species formed following pulsed irradiation within powdered samples as well as from highly scattering interfaces demonstrating that the technique has high potential for investigating heterogeneous photochemical systems.

High-Resolution Atomic-Absorption Spectra of Uranium Obtained by the Flash-Photolysis and Flash-Discharge Techniques*

Leon J. Radziemski, David W. Steinhaus, and Rolf Engleman
J. Opt. Soc. Am. 61(11) 1538-1539 (1971)

Color-center laser spectroscopy of transient species produced by excimer-laser flash photolysis

Horst Adams, Jeffrey L. Hall, L. A. Russell, J. V. V. Kasper, F. K. Tittel, and R. F. Curl
J. Opt. Soc. Am. B 2(5) 776-780 (1985)

Nanosecond Background Source for Flash Photolysis

Heinz Fischer, Emma Duchane, and Alfred Büchler
J. Opt. Soc. Am. 55(10) 1275-1277 (1965)

A Streak Spectrograph for the Analysis of Short-Lived Intermediates Generated by Flash Photolysis or Pulse Radiolysis

Max Klenert
Appl. Opt. 8(3) 593-596 (1969)

A Vacuum Ultraviolet Flash Photolysis Apparatus

W. Braun, Arnold M. Bass, and A. E. Ledford
Appl. Opt. 6(1) 47-49 (1967)