Abstract

Pronounced misalignment of a nominally 10-micronwidth fixed bilateral spectrometer slit brought to our attention the need to conveniently monitor and realign these important spectrometer components. While it is possible to do such realignment manually under a microscope, such an approach is time-consuming, awkward, and imprecise. A simple procedure for measuring slit width, based on diffraction of laser radiation, has been previously reported. Here we describe a simple alignment jig which allows submicron adjustment of slit jaws for parallelism and width. Visual indication of the width achieved is continuously available during the adjustment. The slit jaws are moved with differential screws. A translation stage allows sequential adjustment of alternate ends of the slit, ensuring parallelism.

Two Bilateral Spectrograph Slits

Hermann Roemer and Robert A. Oetjen
J. Opt. Soc. Am. 36(1) 47-51 (1946)

Precise and simple optical alignment method for double-sided lithography

Matthias Gruber, Detlev Hagedorn, and Werner Eckert
Appl. Opt. 40(28) 5052-5055 (2001)

Optical interconnection for a polymeric PLC device using simple positional alignment

Jin Hwa Ryu, Po Jin Kim, Cheon Soo Cho, El-Hang Lee, Chang-Seok Kim, and Myung Yung Jeong
Opt. Express 19(9) 8571-8579 (2011)

New Spectrometer Slit Mechanism*

H. M. Crosswhite and W. G. Fastie
J. Opt. Soc. Am. 46(2) 110-115 (1956)

High Precision Alignment Procedure for an Ellipsometer

J. R. Zeidler, R. B. Kohles, and N. M. Bashara
Appl. Opt. 13(5) 1115-1120 (1974)