Abstract
In recent years, Microscopy/Infrared spectroscopy (Mic/IR) has become an increasingly popular technique. This technique was first introduced in 1953, but did not become commonly applied because of the lengthy time required to obtain spectra. Interest was renewed when specially designed filter instruments, providing high throughput, enabled scanning to be accomplished in more reasonable times. However, FT-IR spectrophotometers have provided both higher sensitivity and resolution in dramatically shorter times than is necessary with filter instruments. Accordingly, FT-IR more appropriately meets the demands of Mic/IR.
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