Abstract
More Like This
Absolute testing of the reference surface of a Fizeau interferometer through even/odd decompositions
R. Schreiner, J. Schwider, N. Lindlein, and K. Mantel
Appl. Opt. 47(32) 6134-6141 (2008)
Absolute testing of flats by using even and odd functions
Chiayu Ai and James C. Wyant
Appl. Opt. 32(25) 4698-4705 (1993)
The validity of “Odd and Even” channels for testing all-optical OFDM and Nyquist WDM long-haul fiber systems
Liang B. Du and Arthur J. Lowery
Opt. Express 20(26) B445-B451 (2012)