Abstract

A study of the determination of metals, nonmetals, and metalloids (F, Cl, Br, I, S, P, Se, As, Sb, and Pb) in the vacuum-ultraviolet spectral region with a kilowatt-plus helium microwave-induced plasma is presented. A spectrometer system similar to that used for far-ultraviolet optical sampling with an inductively coupled plasma was designed and implemented. This arrangement was produced by using an optical sampler to couple the plasma discharge with a helium-purged monochromator. Monitoring was performed at wavelengths less than 200 nm with no N₂ or O₂ in the optical path. Helium was chosen as the purge gas because it is transparent in the wavelength region of interest (>58 nm). Sample introduction was accomplished with ultrasonic nebulization. Limits of detection, linear ranges, and matrix effects caused by group IA and IIA elements were studied. Analytical calibration plots were linear over a range of 2-3 orders of magnitude. Detection limits ranged from 0.06 μg/mL for sulfur to 5 μg/mL for selenium.

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