Abstract

The effects of emitted radiation at the sample position in FT-IR spectrometers can produce spectral distortions and artifacts. Because of the high stray light rejection efficiency of FT-IR, these distortions are presumed to arise from the constant (dc) emission leading to nonlinearity in detector response or to a rise in temperature of the optical bench caused by the hot sample which leads to a drop-off in spectrometer performance. We show that the stray light advantage of FT-IR may not be valid for hot samples because some sample emission makes its way back to the interferometer, where it is modulated and can be passed back to the sample to produce distortions in peak shapes and relative intensities. Several approaches to eliminate these problems are provided.

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