Abstract

In the Pratt Trace Analysis Laboratory an Applied Research Laboratories, (ARL) 2 M grating spectrograph is being used almost exclusively with a direct current source, for high sensitivity methods including the cathode layer technique. Several modifications of the equipment have been made and while only one of these is basically new, they have combined to give such an increase in value to the instrument that it is felt they may be of interest to other users.

A Step-Sector for the Astigmatic Spectrograph

Ralph E. Thiers
J. Opt. Soc. Am. 40(12) 849-851 (1950)

The Spectrographic Detection of Selenium in the D.C. Arc Flame*

Cyrus Feldman
J. Opt. Soc. Am. 35(2) 180-184 (1945)

Modifications of Spectrographic Methods for Analysis of Aluminum and Its Alloys

R. W. Callon and J. E. Burgener
J. Opt. Soc. Am. 34(9) 543-549 (1944)

A D.C. Arc Source and Automatic Controller*

G. H. Fetterley and W. M. Hazel
J. Opt. Soc. Am. 40(2) 76-79 (1950)

Optical contamination: its prevention in the XUV spectrographs flown by the U.S. Naval Research Laboratory in the Apollo Telescope Mount

W. R. Hunter
Appl. Opt. 16(4) 909-916 (1977)