Abstract

We present a spectroscopic technique that is a hybrid between reflection-absorption and attenuated total reflection (ATR) spectroscopy. The method, which we call attenuated internal reflection (AIR), is suitable for the investigation of thin film liquids on non- or weakly absorbing substrates. In AIR the interrogating infrared beam is not exposed to vapor that may be associated with the film, but unlike ATR there are few geometric constraints on the substrate. We show the theoretical basis for the method and results from experiments demonstrating its use.

Enhanced photoluminescence spectroscopy for thin films using the attenuated total reflection method

Takashi Wakamatsu, Tadaaki Kitami, Tomoaki Maruyama, and Susumu Toyoshima
Appl. Opt. 50(5) 696-700 (2011)

Thin-film absorption coefficients by attenuated-total-reflection spectroscopy

R. T. Holm and E. D. Palik
Appl. Opt. 17(3) 394-403 (1978)

Water absorption studies in thin films by the IR attenuated total reflection method

P. V. Ashrit, S. Badilescu, Fernand E. Girouard, and Vo-Van Truong
Appl. Opt. 28(3) 420-422 (1989)

Attenuated total reflectance spectroscopy with chirped-pulse upconversion

Hideto Shirai, Constance Duchesne, Yuji Furutani, and Takao Fuji
Opt. Express 22(24) 29611-29616 (2014)

Totally Internally Reflecting Thin-Film Optical Cavities

J. T. Boyd
Appl. Opt. 11(11) 2635-2638 (1972)